Shenzhen Han's Semiconductor Test Technology Co., Ltd.

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CERES 900 Digital Analog Mixed Signal Test System

Ceres 900 is an all-in-one test system with 32 universal slots for testing power management and mixed-signal chips. Through optimized design, the system has comprehensively improved the testing speed and repeatability of the equipment. Compared with its peers, the Ceres 900 has faster testing speed and the unit test efficiency has been improved by at least 2 times.

Ceres 900 system programming environment is based on Win10 and Visual Studio C++. The system software architecture supports extended upgrades and is compatible with the original program. The GUI-style system's user interface makes it easy for users to maintain, manage, and use programming tools. Ceres 900 system has realized one-stop management of system functions.

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Features

Improving chip testing efficiency by 3-10 times, reduce equipment demand, equipment purchase expenses, floor space, and energy consumption;

32 universal module slots for flexible configuration and expansion;

Designed for mixed-signal application testing of up to 1024 sites, simple and fast multi-site program development;

Low latency, high bandwidth, multi-site communication bus;

Test head with adjustable speed air cooling system;

Dual PC structure, running faster, user program does not need to be re-calibrated and upgraded;

Load board calibration and device test are equipped with high-precision TMU and 6.5-bit DMM, easy and low cost calibration;

On-site real-time system diagnostics, no need to disassemble modules.
Parameters & Configuration
System&Module

System board

Analog signal test module AP-150

Voltage and current test module VI-150

Digital signal test module DP-150
Application Scenarios

Mixed-signal chip

Automotive power chip

Linear voltage regulator RF transceiver

Power management chip

Switch/circuit protection chip

Battery management chip

Power chip

Driver chip
Operating Efficiency Display

CERES 900 Digital Analog Mixed Signal Test System

Features

Parameters & Configuration

System&Module

System board

Analog signal test module AP-150

Voltage and current test module VI-150

Digital signal test module DP-150

Application Scenarios

Operating Efficiency Display